Boundary Scan and Flying Probe Test Seminar

Test Coach Corporation, a member of GOEPEL electronic's GATE program, hosts a "Boundary Scan and Flying Probe Test Seminar" on February 7th, 2012, in Lake Zurich, Illinois. Topics include:

  • A summary of Boundary Scan test development from basic bscan test to processor emulation test, illustrating reusability and portability (presented by Heiko Ehrenberg, GOEPEL Electronics)
  • Overview of Flying Probe test development, with a focus on test coverage using multiple techniques. The technology advancements of the latest generation machines will also be presented. (Andy Smithers, SPEA America)
  • Identifying the test strategy choices for products at various stages in the life cycle (presented by Jim Arient, Test Coach Corporation)