At IPC APEX 2012, we demonstrated version 4.6 of our Boundary Scan software platform SYSTEM CASCON™. With this version we are introducing the concept of Embedded System Access (ESA) technologies. Embedded System Access stands in contrast to intrusive board access (IBA) techniques, such as bed-of-nail or flying-probe based in-circuit test, and native connector access, as commonly applied for functional test. Yet, ESA and these other access techniques do not necessarily have to be used exclusively, but rather can be combined in integrated test solutions.
Modern printed circuit board assemblies (PCBAs) provide increasing functionality, often coupled with a high degree of complexity and integration, with limited physical access through physical probing (intrusive board access). Sufficient access is the central problem for all test methodologies. Embedded System Access (ESA) technologies enable the use of standardized instrumentation platforms throughout the entire product life cycle, allowing the reuse of existing applications and increasing the fault coverage of production tests. ESA is primarily based on access through the JTAG port defined in IEEE 1149.1 (or IEEE 1149.7) and on test resources defined in those and other related standards (such as IEEE 1149.4, IEEE 1149.6, IEEE 1500, and the upcoming IEEE P1687, for example). The following graphic shows a classification of major access techniques and test methodologies:
GOEPEL Electronics supports all ESA techniques through its VarioCORE, VarioTAP, and ChipVORX technologies, fully integrated in the software platform SYSTEM CASCON. Furthermore, such ESA applications can be combined with other test techniques through various integration packages and technologies such as HyScan and Virtual ScanPin.