New mixed-signal JTAG I/O module

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CION LX module FXT96 At International Test Conference (ITC) 2014 in Seattle, GOEPEL Electronics introduced the CION-LX Module/FXT96, a new mixed-signal JTAG I/O module enabling boundary-scan based tests to non scannable circuit components such as connectors, clusters, or analog interfaces.

CION-LX Module/FXT96 supports test standards such as IEEE 1149.1, IEEE 1149.6, and IEEE 1149.8.1. The module provides 96 single-ended, 12 High Current, and 24 differential test channels. Each channel is bi-directional and their parameters can be configured. Unique in the industry, dynamic test resources such as frequency counter, event detector, arbitrary waveform generator and digitizer are available. This new module is based on CION-LX™, a JTAG controllable Mixed Signal Tester-on-Chip (ToC), developed by GOEPEL electronics.

“We set entirely new standards with the new CION-LX Module/FXT96 in regards to flexibility and functionality of JTAG controlled I/O modules”, says Heiko Ehrenberg of GOEPEL Electronics USA. “We can offer our customers a simple, safe, and affordable solution to enhance their boundary-scan application significantly. With the test resources available per channel, both static and dynamic at-speed-tests are possible – which means significant improvement of structural test coverage and even more flexible test strategies for our customers.”

CION-LX Module/FXT96 can be connected to any Test Access Port (TAP) and can be cascaded to increase the number of channels. It can be operated in combination with other CION modules™ or ChipVORX modules™. Using the boundary-scan software platform SYSTEM CASCON™ a comprehensive automation of the entire project development is possible with minimal effort. Detected errors can be immediately displayed graphically in the PCBA layout with the Scan Vision™ tools. CION-LX Module/FXT96 can be used both for prototype test in the laboratory as well as in production.