Test Strategy for IoT Devices receives Embedded World 2016 Award

At Embedded World 2016 in Nuremberg, JEDOS (GOEPEL’s test and diagnostics tool for electronic assemblies) received the embedded Award 2016 in the tools category.

With the Embedded Award, a high-ranking jury with representatives from science research, industry, and media recognizes innovative products and solutions that advance the industry of embedded systems and the IoT (Internet of Things) in outstanding ways. 
The award ceremony took place during a press conference by Prof. Matthias Sturm, Chairman of the Advisory Board of the embedded world, and Dr. Roland Fleck, Managing Director of Nürnberg Messe on the first day of Embedded World.

“We are proud of the high recognition our JEDOS test and diagnostic tool enjoys. Winning this award shows us that with our integrated technology platform we’re on the right track”, says Thomas Wenzel, Managing Director of the JTAG/Boundary Scan division of GOEPEL electronic, after accepting the award. “By integrating embedded diagnostics test and JTAG/boundary scan, we are addressing the latest test challenges posed by complex electronic designs, such as Internet of Things components.”

First introduced in 2015, JEDOS is a platform for high-quality embedded tests of complex electronic design. JEDOS offers a variety of functions for test, validation, calibration, and device programming. Using the native processor, diagnostic functional tests can be performed in real time. A key advantage of JEDOS is the possibility to fully test IoT components without the use of firmware. By integrating of boundary scan and functional embedded test and diagnostics, dependable test and fault coverage can be achieved. As a result, firmware and software engineers can benefit from pre-verified prototype hardware, making their development and debug work more efficient.

To learn more about JEDOS, please view this webinar or contact GOEPEL.