Products

High-speed programming with RAPIDO

This short video shows RAPIDO in action: high-speed programming on up to 32 boards in parallel. For more details, visit http://www.goepelusa.com/model/rapido/.  

http://www.youtube.com/watch?v=Ji1ejOlLZ0c

This video has been recorded at electronica 2014 in Munich, Germany, demonstrating high-speed in-system programming and boundary-scan testing of ten boards in parallel. In actual use, RAPIDO would be used in-line in the manufacturing environment.

Details and product brief can be found on GOEPEL's website. Or, simply send us your inquiry.

New mixed-signal JTAG I/O module

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CION LX module FXT96 At International Test Conference (ITC) 2014 in Seattle, GOEPEL Electronics introduced the CION-LX Module/FXT96, a new mixed-signal JTAG I/O module enabling boundary-scan based tests to non scannable circuit components such as connectors, clusters, or analog interfaces.

CION-LX Module/FXT96 supports test standards such as IEEE 1149.1, IEEE 1149.6, and IEEE 1149.8.1. The module provides 96 single-ended, 12 High Current, and 24 differential test channels. Each channel is bi-directional and their parameters can be configured. Unique in the industry, dynamic test resources such as frequency counter, event detector, arbitrary waveform generator and digitizer are available. This new module is based on CION-LX™, a JTAG controllable Mixed Signal Tester-on-Chip (ToC), developed by GOEPEL electronics.

“We set entirely new standards with the new CION-LX Module/FXT96 in regards to flexibility and functionality of JTAG controlled I/O modules”, says Heiko Ehrenberg of GOEPEL Electronics USA. “We can offer our customers a simple, safe, and affordable solution to enhance their boundary-scan application significantly. With the test resources available per channel, both static and dynamic at-speed-tests are possible – which means significant improvement of structural test coverage and even more flexible test strategies for our customers.”

CION-LX Module/FXT96 can be connected to any Test Access Port (TAP) and can be cascaded to increase the number of channels. It can be operated in combination with other CION modules™ or ChipVORX modules™. Using the boundary-scan software platform SYSTEM CASCON™ a comprehensive automation of the entire project development is possible with minimal effort. Detected errors can be immediately displayed graphically in the PCBA layout with the Scan Vision™ tools. CION-LX Module/FXT96 can be used both for prototype test in the laboratory as well as in production.

SYSTEM CASCON Quick Reference Guide

This blog entry provides a quick reference guide for CASCON GALAXY Development Station packages. GOEPEL offers a variety of software packages for the development and execution of Embedded System Access (ESA) applications, such as JTAG / boundary-scan test, in-system programming, processor emulation test, and control of chip-embedded instrumentation. Some of those software packages are configured for test development (DS packages) and some for test execution only (TS packages). Quick Reference Guide

The table on the right provides a quick reference of the tools included in the four major CASCON GALAXY Development Station (DS) packages:

  • CASCON GALAXY Base Edition,
  • Standard Edition,
  • Classic Edition, and
  • Advanced Edition.

 

Contact GOEPEL for more information on any of its software and hardware products.